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In this free webinar, Vittorio Serra from Lauterbach and Curt Hillier from NXP Semiconductors demonstrate how Lauterbach’s TRACE32® tools integrate with NXP’s S32 platforms to streamline software-defined vehicle (SDV) development using virtual prototypes and remote access.

Key topics and takeaways:

  • Gain insights into cloud-based debugging: Eliminate hardware dependency with remote access to virtual S32 targets.
  • Explore optimized workflows for SDVs: Tailored for zonal, central, domain and ADAS architectures.
  • Discover advanced debugging & profiling: Unlock deep performance insights with TRACE32’s debug and real-time trace tools.
  • Learn about seamless integration: Accelerate development with pre-integrated stacks and CI/CD compatibility.

Webinar video

Meet the experts

Curt Hillier

Fellow, Automotive System Engineering and Marketing, NXP Semiconductors

Vittorio Serra

Field Application Engineer, Lauterbach GmbH