David Xu of Renesas explains how to use a group of single-chip MCUs to reduce costs and expedite the development of automotive electrical body applications.
Iain Dodds of VI-grade explains how a combination of software simulation solutions can facilitate a zero prototypes development process.
Continental’s José Molinar discusses the future of intelligent battery sensor (IBS) diagnosis and provides insight into enhanced battery diagnosis with cloud connectivity.
FEV’s Ceren Acar provides unique insight into cutting-edge, cloud-connected battery management systems for hybrid and electric vehicles.
Martin Pfeifle of NNG and Petri Marjava of Vaisala present a solution that offers automakers a cost-effective solution to meet advanced driver assist criteria.
Michael Hoffmann and Alessandro Baldari of VI-grade explains how to overcome vehicle development, testing, and validation challenges using a flexible XIL-system.
Experts from Tensorleap, Cognata, and Foresight discuss ways to overcome the complexities of developing automotive AI, resolving model weaknesses, and pinpointing the data you need.
Steve Harding of HERE Technologies explains the impact of recent advancements in digital maps and their effects on the global industry.
Elektrobit’s Joel Thurlby and Moritz Neukirchner discuss the role of a bare-metal hypervisor in abstracting vehicle resources and allocating them to clusters of vehicle functions in a SDV.
KPIT’s Radhesh Bhat explains the challenges of tuning the automotive ISP and how having a sophisticated ISP tuning tool environment helps achieve the desired image quality.
Continental’s Jesreel Baybay discusses the emergence of zone control units, which reduce the number of ECUs required by connecting the sensors and actuators from different domains.
Elektrobit’s Joel Thurby and Kai Lampka discuss the challenges in migrating the architecture of ECUs and the revolution in the approach to sharing a common platform.
Dell Technologies and dSPACE experts describe how modular HiL/SiL systems and end-to-end data management can come together to offer the most flexible, complete system for simulation and validation.
Dr Marta Martínez Vázquez of Renesas presents the basics of mmWave radar for automotive applications and underline the challenges and trade-offs in radar design.
FEV’s Dr Umesh N. Hivarkar explains the role engineering data science will play in shaping the future of mobility.
Yajie Wang of Renesas presents the RH850/C1M-Ax microcontroller (MCU), which paves the way for next-generation e-drive inverters and is ideal for highly cost-optimized ASIL-C automotive traction motor control systems.
Jonpaul S. Jandu of Renesas presents a cost-effective digital instrument cluster with an integrated surround-view monitor that meets ISO26262 ASIL B requirements.
NXP’s Baptiste Vignasse and Jérôme Dietsch explain how to increase fault tolerance and maintain motor control functionality if failure occurs.
HiL experts discuss how to synchronize development between the OEM and supplier by employing Hardware-in-the-Loop (HiL) testing, where the real component is integrated into a real-time simulated environment.
KPIT’s Stefan Zeppetzauer and Amit Shah present a comprehensive approach to electro-mechanical diagnostics coupled with the diagnostics of software running on HPCs within the software-defined vehicle.