In this free webinar, NXP’s Bétina Bebey discusses the GD3162 gate driver, which is designed to drive the latest SiC and IGBT modules for xEV traction inverters.

During the webinar, Bétina demonstrates how the GD3162 gate driver can significantly enhance efficiency by dynamically adjusting gate strength and monitoring power module health through device aging detection. She also highlights its role in reducing system costs with its unique DC link discharge feature.

Key topics and takeaways:

• Gain insight into the main challenges of xEV traction inverters
• Discover how the GD3162 gate driver can help overcome these challenges in 800V and SiC traction inverters
• Learn how to shorten the traction inverter development cycle using the GD3162 gate driver